Trace characterization, chemical and physical.
W. Wayne Meinke and Bourdon F. Scribner, editors [from the] Institute for Materials Research.
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| Format: | Journal / Serial |
| Language: | English |
| Published / Created: |
[Washington]
Dept. of Commerce, National Bureau of Standards; for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1967.
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| Series: | NBS monograph ;
100. |
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| Notes: | "Based on lectures and discussions of the 1st Materials Research Symposium held at the NBS, Gaithersburg, Maryland, October 3-7, 1966." Includes bibliographies. Physical description: xiii, 580 p. illus. 25 cm. more |